calculates the energy, linear energy transfer (LET), or range of heavy ions. The ongoing miniaturization of electronic devices is accompanied by a constant reduction of the critical charge capable of changing logic state in the device. As a consequence, these devices are increasingly susceptible to soft and hard errors caused by a single heavy ion passing through sensitive volume of the device. Such errors are called single event upsets (SEU). The upset probability depends on the linear energy transfer (LET) of the heavy ion projectile.
Heavy ion beams suitable for SEU testing are obtained at facilities attached to low energy heavy ion accelerators. The beam energy is determined by the accelerator operational parameters and beamline optics, and then is used to calculate the LET value, usually by using the semi-empirical formulas developed by J. F. Ziegler.
For a given heavy ion energy, LET, or range, the Energy-LET-Range calculator calculates the remaining two parameters. Target materials can be added with a simple material editor.